The ‘Worst Test in Medicine’ is Driving America’s High C-Section Rate

Round-the-clock fetal monitoring leads to unnecessary C-sections. But it’s used in nearly every birth because of business and ...
IEEE

JAVA Mobile Application Development Course Under the Framework of Industry-Education Integration: Practice of Deep Learning and Neural Network Integration

Abstract: The popularization of AI technology, yes the emerging technology represented by deep learning and neural network has gradually become an important tool for solving complex problems.