An SCR topology transmogrifies into BJT two-wire precision current source with a self-resetting fault-current limiter.

Abstract: Accelerated lifetime tests (ALTs) play a critical role in long-term reliability studies of SiC MOSFETs, including lifetime estimation, failure analysis, and condition monitoring. This ...

Abstract: The use of wide bandgap (WBG) power semiconductor devices in the transportation electrification area is gaining increased interest due to high power density, low power losses, high switching ...