The National Testing Agency (NTA) will soon release the advanced city intimation slip for the Joint Entrance Examination (JEE ...
Abstract: In sub-28-nm nodes, existing optical critical dimension (OCD) metrology tools are challenging to simultaneously and thoroughly meet the metrology requirements of the wafer-level ...
More than a century after Srinivasa Ramanujan scribbled his astonishing formulas for π in notebooks in India and England, ...
Abstract: In recent years, deep learning-based methods have been introduced for solving inverse scattering problems (ISPs), but most of them heavily rely on large training datasets and suffer from ...