JEE Advanced may change big time: IITs consider adaptive testing to cut stress & coaching dependence

In attempts to make JEE Advanced “more friendly” and “less stressful,” the IIT Council is considering redesigning the entrance test by introducing optional tests and more.
IEEE

3-D Modeling of Fringe Gate Capacitance in Complementary FET (CFET)

Abstract: In this work, an analytical model for fringe gate capacitance in complementary FET (CFET) is proposed. Three kinds of CFET based on the fin, gate-all-around (GAA) nanowire, and nanosheet are ...