Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...