Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Laerte Patera from the Department of Physical Chemistry was recently awarded funding from the Austrian Science Fund (FWF). As part of the consortium ...

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...

Schematic diagrams illustrating the atomic arrangement of an MoS₂ specimen observed using 4D-STEM, showing atomic-scale mapping in real-space coordinates x and y and corresponding diffraction patterns ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...

NC-AFM 2026 is the 27 th of a series of conferences devoted to non-contact atomic force microscopy. The conference covers ...